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dc.contributor.author이연희-
dc.contributor.author한승희-
dc.contributor.author이정혜-
dc.contributor.author윤정현-
dc.date.accessioned2024-01-21T20:07:14Z-
dc.date.available2024-01-21T20:07:14Z-
dc.date.created2022-01-10-
dc.date.issued1996-01-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/144749-
dc.titleCharacterization of plasma ion implanted surfaces using time-of-flight secondary ion mass spectrometry.-
dc.typeArticle-
dc.description.journalClass3-
dc.identifier.bibliographicCitationJournal of Korean institute of surface engineering, v.v. 29, no.no. 6, pp.? - ?-
dc.citation.titleJournal of Korean institute of surface engineering-
dc.citation.volumev. 29-
dc.citation.numberno. 6-
dc.citation.startPage?-
dc.citation.endPage?-
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