Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 이연희 | - |
dc.contributor.author | 한승희 | - |
dc.contributor.author | 이정혜 | - |
dc.contributor.author | 윤정현 | - |
dc.date.accessioned | 2024-01-21T20:07:14Z | - |
dc.date.available | 2024-01-21T20:07:14Z | - |
dc.date.created | 2022-01-10 | - |
dc.date.issued | 1996-01 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/144749 | - |
dc.title | Characterization of plasma ion implanted surfaces using time-of-flight secondary ion mass spectrometry. | - |
dc.type | Article | - |
dc.description.journalClass | 3 | - |
dc.identifier.bibliographicCitation | Journal of Korean institute of surface engineering, v.v. 29, no.no. 6, pp.? - ? | - |
dc.citation.title | Journal of Korean institute of surface engineering | - |
dc.citation.volume | v. 29 | - |
dc.citation.number | no. 6 | - |
dc.citation.startPage | ? | - |
dc.citation.endPage | ? | - |
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