KIST Library Institutional Repository

Characterization of plasma ion implanted surfaces using time-of-flight secondary ion mass spectrometry.

Authors

이연희; 한승희; 이정혜; 윤정현

Issue Date

1996-01

Citation

Journal of Korean institute of surface engineering, v.v. 29, no.no. 6, pp.? - ?

URI

https://pubs.kist.re.kr/handle/201004/144749

Appears in Collections:

KIST Article > Others

Files in This Item:

There are no files associated with this item.

Export

RIS (EndNote)

XLS (Excel)

XML