Measurement of lattice parameter of primary Si crystal in rheocast hypereutectic Al-Si alloy by convergent beam electron diffraction technique.
- Other Titles
- 수렴성빔 전자회절법을 이용한 리오캐스팅시킨 과공정 Al-Si 합금에서 실리콘초정의 격자상수 측정 =
- Authors
- 김긍호; 이호인; 이정일
- Issue Date
- 1995-01
- Citation
- 한국전자현미경학회지 = Korean journal of electron microscopy, v.v. 25, no.no. 3, pp.99 - 107
- Keywords
- hypereutectic Al-Si alloy
- URI
- https://pubs.kist.re.kr/handle/201004/145214
- Appears in Collections:
- KIST Article > Others
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