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GROWTH AND CHARACTERIZATION OF GAAS-IN BY A NEW HORIZONTAL ZONE MELT TECHNIQUE

Authors

PARK, YJ; HAN, CW; SHIM, KB; PARK, SC; KIM, CB; MIN, SK

Issue Date

1990-08

Publisher

ELSEVIER SCIENCE BV

Citation

JOURNAL OF CRYSTAL GROWTH, v.104, no.3, pp.610 - 616

Keywords

HZM; DMF; CCD camera; GaAs; hardening effect

ISSN

0022-0248

URI

https://pubs.kist.re.kr/handle/201004/147075

DOI

10.1016/0022-0248(90)90004-5

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KIST Article > Others

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