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X-RAY AND DLTS CHARACTERIZATIONS OF INXGA1-X AS(X-LESS-THAN-0.03)/GAAS LAYERS GROWN BY VPE USING AN IN/GA ALLOY SOURCE

Authors

KIM, HS; KIM, EK; MIN, SK; LEE, CC

Issue Date

1989-08

Publisher

SPRINGER VERLAG

Citation

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, v.49, no.2, pp.143 - 147

Keywords

X-ray; DLTS; InGaAs/GaAs layer; VPE

ISSN

0947-8396

URI

https://pubs.kist.re.kr/handle/201004/147332

DOI

10.1007/BF00616292

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KIST Article > Others

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