Vieillissement des transistors MOS submicroniques apres contrainte electrique revue.

Authors
강광남
Issue Date
1984-01
Citation
Phys. appl., v.v. 19, pp.933 - ?
Keywords
transistors MOS
URI
https://pubs.kist.re.kr/handle/201004/148050
Appears in Collections:
KIST Article > Others
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