KIST Library Institutional Repository

Thickness measurement conditions for amorphous ultra-thin film using HAADF-STEM

Authors

Minyoung Na; 곽계영; 김태건; 김경중; Hye Jung Chang

Issue Date

2021-10

Publisher

한국표면분석학회

Citation

2021년도 제15회 표면분석심포지엄

ISSN

-

URI

https://pubs.kist.re.kr/handle/201004/77342

Appears in Collections:

KIST Conference Paper > 2021

Files in This Item:

There are no files associated with this item.

Export

RIS (EndNote)

XLS (Excel)

XML