In-situ TEM system for electric/magnetic materials
- Authors
- Hye Jung Chang
- Issue Date
- 2021-08-10
- Publisher
- APCTP
- Citation
- The 2nd International Workshop on Scanning Probe Microscopy, pp.23
- Abstract
- We can infer electric or magnetic property changes by analyzing atomic structure or electric/magnetic domain structure. We can implement real-time measurement and observation simultaneously in TEM by controlling temperature, electric bias/current, magnetic field and etc. In this talk, our recent in-situ TEM works in electric/magnetic mateirlas will be introduced; atomic and electronic reconstruction at the ferroelectric oxide interface and skyrmion magnetic structure evolution.
- ISSN
- -
- URI
- https://pubs.kist.re.kr/handle/201004/77357
- Appears in Collections:
- KIST Conference Paper > 2021
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