In-situ TEM system for electric/magnetic materials

Authors
Hye Jung Chang
Issue Date
2021-08-10
Publisher
APCTP
Citation
The 2nd International Workshop on Scanning Probe Microscopy, pp.23
Abstract
We can infer electric or magnetic property changes by analyzing atomic structure or electric/magnetic domain structure. We can implement real-time measurement and observation simultaneously in TEM by controlling temperature, electric bias/current, magnetic field and etc. In this talk, our recent in-situ TEM works in electric/magnetic mateirlas will be introduced; atomic and electronic reconstruction at the ferroelectric oxide interface and skyrmion magnetic structure evolution.
ISSN
-
URI
https://pubs.kist.re.kr/handle/201004/77357
Appears in Collections:
KIST Conference Paper > 2021
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