Stable haptic interaction for AFM-based nanomanipulation

Authors
Lim, Y.-A.Lee, C.G.Kim, J.-P.Ryu, J.
Issue Date
2009-07
Publisher
IEEE
Citation
IEEE International Symposium on Industrial Electronics, IEEE ISIE 2009, pp.983 - 988
Abstract
This paper addresses stable haptic interaction for AFM(atomic force microscope)-based nanomanipulation. The EBA(energy-bounding algorithm), a passivity-based haptic control algorithm, is modified to include the scaling factors in the scaled bilateral teleoperation, and a commercial AFM is revised to be used as a nanomanipulation system with a I-DOF custom-built haptic interface. Preliminary experiments show that the modified EBA can maintain stability during the interaction between an AFM probe and the surface of a sample for any force scaling factors. ?2009 IEEE.
ISSN
0000-0000
URI
https://pubs.kist.re.kr/handle/201004/80947
DOI
10.1109/ISIE.2009.5222558
Appears in Collections:
KIST Conference Paper > 2009
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE