Stable haptic interaction for AFM-based nanomanipulation
- Authors
- Lim, Y.-A.; Lee, C.G.; Kim, J.-P.; Ryu, J.
- Issue Date
- 2009-07
- Publisher
- IEEE
- Citation
- IEEE International Symposium on Industrial Electronics, IEEE ISIE 2009, pp.983 - 988
- Abstract
- This paper addresses stable haptic interaction for AFM(atomic force microscope)-based nanomanipulation. The EBA(energy-bounding algorithm), a passivity-based haptic control algorithm, is modified to include the scaling factors in the scaled bilateral teleoperation, and a commercial AFM is revised to be used as a nanomanipulation system with a I-DOF custom-built haptic interface. Preliminary experiments show that the modified EBA can maintain stability during the interaction between an AFM probe and the surface of a sample for any force scaling factors. ?2009 IEEE.
- ISSN
- 0000-0000
- URI
- https://pubs.kist.re.kr/handle/201004/80947
- DOI
- 10.1109/ISIE.2009.5222558
- Appears in Collections:
- KIST Conference Paper > 2009
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