DSpace at KIST: Electrical properties and microstructural characterization of single ZnO nanowire sensor manufactured by focused ion beam

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DSpace at KISTKIST Conference Paper 2008

Electrical properties and microstructural characterization of single ZnO nanowire sensor manufactured by focused ion beam

Authors: Ahn, Jae Pyoung

Issue Date: 2008-08

Publisher: ICMAP

Citation: 2008 International Conference on Microelectronics and Plasma Technology

URI: https://pubs.kist.re.kr/handle/201004/81039

Appears in Collections:: KIST Conference Paper > 2008

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