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Surface Analysis and Depth Profiling of Polymers by TOF-SIMS

Authors

LEE, YEON HEE; Lee Ji-hye; 김선희; Kang Minhwa

Citation

The 15th Scientific International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions

URI

https://pubs.kist.re.kr/handle/201004/93281

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KIST Conference Paper > Others

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