Microstructural analysis of oxide layer formation of ferritic stainless steel interconnect

Authors
Hong Seung HeeHeung Nam HanPhaniraj MadakashiraKim, Dong-IkAhn, Jae PyoungCho, Young Whan
Citation
Microscopy of oxidation 8
Keywords
SOFC; Interconnect; EBSD; TEM; oxidation
URI
https://pubs.kist.re.kr/handle/201004/98014
Appears in Collections:
KIST Conference Paper > Others
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE