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Microstructural analysis of oxide layer formation of ferritic stainless steel interconnect

Authors

Hong Seung Hee; Heung Nam Han; Phaniraj Madakashira; Kim, Dong-Ik; Ahn, Jae Pyoung; Cho, Young Whan

Citation

Microscopy of oxidation 8

Keywords

SOFC; Interconnect; EBSD; TEM; oxidation

URI

https://pubs.kist.re.kr/handle/201004/98014

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KIST Conference Paper > Others

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