Effect of reactive gas of fluorides on Si etching by using ICP-RIE

Other Titles
ICP-RIE를 이용한 실리콘 식각에 미치는 플루오르계 반응 가스의 영향
Authors
Sang-Heon KimJung, Sung MokKim, Young-Hwan
Citation
한국진공학회 제34회 정기학술대회, pp.246
Keywords
실리콘 나노선; ICP-RIE; 수직 식각
URI
https://pubs.kist.re.kr/handle/201004/98396
Appears in Collections:
KIST Conference Paper > Others
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