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Thermal stability of TiAlN/CrN multilayer coatings studied by Atom Probe Tomography

Authors

P.P. Choi; I. Povstugar; Ahn, Jae Pyoung; A. Kostka; D. Raabe

Citation

IFES 2010

Keywords

Hard coating; atom probe microscopy; multilayer; thermal stability; atom probe tomography

URI

https://pubs.kist.re.kr/handle/201004/98457

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KIST Conference Paper > Others

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