Spectroscopic Ellipsometry and Raman Spectroscopy of Ge-doped SbTe Thin Films

Authors
Jun-Woo ParkHosun LeeTae Dong KangAndrei SirenkoLee Hyun SeokLee SuyounJeung-hyun JeongCHEONG, BYUNG KI
Citation
Material Research Society
URI
https://pubs.kist.re.kr/handle/201004/99069
Appears in Collections:
KIST Conference Paper > Others
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