Browsing byAuthorBarraud, Sylvain

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Showing results 1 to 7 of 7

Issue DateTitleAuthor(s)
2018-09A Simple Method for Estimation of Silicon Film Thickness in T-Gate Junction less TransistorsJeon, Dae-Young; Park, So Jeong; Mouis, Mireille; Barraud, Sylvain; Kim, Gyu-Tae; Ghibaudo, Gerard
2020-09Channel width dependent subthreshold operation of tri-gate junctionless transistorsJeon, Dae-Young; Mouis, Mireille; Barraud, Sylvain; Ghibaudo, Gerard
2022-06Channel-Width-Dependent Mobility Degradation in Bulk Conduction Regime of Tri-Gate Junctionless TransistorsJeon, Dae-Young; Mouis, Mireille; Barraud, Sylvain; Ghibaudo, Gerard
2020-11Controlling the Effective Channel Thickness of Junctionless Transistors by Substrate BiasJeon, Dae-Young; Mouis, Mireille; Barraud, Sylvain; Ghibaudo, Gerard
2021-06Impact of Channel Length on the Operation of Junctionless Transistors With Substrate BiasingJeon, Dae-Young; Mouis, Mireille; Barraud, Sylvain; Ghibaudo, Gerard
2017-03Impact of series resistance on the operation of junctionless transistorsJeon, Dae-Young; Park, So Jeong; Mouis, Mireille; Barraud, Sylvain; Kim, Gyu-Tae; Ghibaudo, Gerard
2018-03Series resistance in different operation regime of junctionless transistorsJeon, Dae-Young; Park, So Jeong; Mouis, Mireille; Barraud, Sylvain; Kim, Gyu-Tae; Ghibaudo, Gerard

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