1998-05 | Cu films by partially ionized beam deposition for ultra large scale integration metallization | Kim, KH; Jang, HG; Han, S; Jung, HJ; Koh, SK; Choi, DJ |
2001-01 | Densification method of screen printed PZT(52/48) thick films | Kim, YB; Kim, TS; Choi, KS; Choi, DJ |
2003-06 | Effect of structural properties on electrical properties of lanthanum oxide thin film as a gate dielectric | Jun, JH; Choi, DJ; Kim, KH; Oh, KY; Hwang, CJ |
2005-09 | Effects of annealing process on dielectric properties of (Ba,Sr)TiO3 thin films grown by RF magnetron sputtering | Ha, JY; Choi, JW; Kang, CY; Karmanenko, SF; Yoon, SJ; Choi, DJ; Kim, HJ |
2001-12 | Effects of thermal annealing a glass surface in air | Jang, HK; Whangbo, SW; Choi, YK; Jeong, K; Whang, CN; Wang, CH; Choi, DJ; Lee, S |
2005-04-15 | Effects of ZnO on piezoelectric properties of 0.01PMW-0.41PNN-0.35PT-0.23PZ ceramics. | Ha, JY; Choi, JW; Kang, CY; Choi, DJ; Kim, HJ; Yoon, SJ |
2001-11 | Electrical properties of 3-component piezoelectric thick films by screen printing method | Kim, YB; Kim, HJ; Cheon, CI; Choi, DJ; Kim, TS |
1998-11 | Electrostatic bonding of silicon-to-ITO coated #7059 glass using Li-doped oxide interlayer | Jeong, JW; Ju, BK; Lee, DJ; Lee, YH; Oh, MH; Choi, DJ |
2001-04 | Hydrophilic group formation and cell culturing on polystyrene Petri-dish modified by ion-assisted reaction | Kim, KH; Cho, JS; Choi, DJ; Koh, SK |
2003-10 | Microwave dielectric properties of Bi2O3-doped Ca[(Li1/3Nb2/3)(1-x)Ti-x]O3-delta ceramics | Ha, JY; Choi, JW; Yoon, SJ; Choi, DJ; Yoon, KH; Kim, HJ |
2004-08-16 | Optical and electrical transport properties in silicon carbide nanowires | Seong, HK; Choi, HJ; Lee, SK; Lee, JI; Choi, DJ |
2002-11 | Preparation of diffuser type micropump using screen-printed PZT-PCW thick films | Kim, YB; Kim, HJ; Cheon, CI; Choi, DJ; Kim, TS |
2001-12 | RuO2 sputtered thin film supercapacitor's performance as function of oxygen incorporation | Lim, JH; Choi, DJ; Cho, WI; Yoon, YS |
2001-10-01 | Solid-state thin-film supercapacitor with ruthenium oxide and solid electrolyte thin films | Yoon, YS; Cho, WI; Lim, JH; Choi, DJ |
1999-05-15 | The characteristics of interfacial strains developed in silicon by wet O-2 oxidation | Shin, DW; You, YH; Choi, DJ; Kim, GH |
2001-04 | The effect of input gas ratio on the growth behavior of chemical vapor deposited SiC films | Oh, JH; Oh, BJ; Choi, DJ; Kim, GH; Song, HS |
2002-12-02 | The microstructural effect of chemically vapor infiltrated SiC whiskered thin film on the green body of SiC/C composites | Lee, YJ; Hwang, SM; Choi, DJ; Park, SH; Kim, HD |
1999-06-01 | The stacking faults and their strain effect at the Si/SiO2 interfaces of a directly bonded SOI (silicon on insulator) | Shin, DW; Choi, DJ; Kim, GH |
2001-03 | Thin film supercapacitors using a sputtered RuO2 electrode | Lim, JH; Choi, DJ; Kim, HK; Cho, WI; Yoon, YS |
1997-11-15 | Tilt-axis effect on oxidation behaviour and capacitance-voltage characteristics of (100) silicon | Woo, HJ; Choi, DJ; Kim, GH |