Showing results 1 to 12 of 12
Issue Date | Title | Author(s) |
---|---|---|
2018-09 | A Simple Method for Estimation of Silicon Film Thickness in T-Gate Junction less Transistors | Jeon, Dae-Young; Park, So Jeong; Mouis, Mireille; Barraud, Sylvain; Kim, Gyu-Tae; Ghibaudo, Gerard |
2008-10 | Analytic Model for Low-Frequency Noise in Nanorod Devices | Lee, Jungil; Yu, Byung Yong; Han, Ilki; Choi, Kyoung Jin; Ghibaudo, Gerard |
2020-09 | Channel width dependent subthreshold operation of tri-gate junctionless transistors | Jeon, Dae-Young; Mouis, Mireille; Barraud, Sylvain; Ghibaudo, Gerard |
2022-06 | Channel-Width-Dependent Mobility Degradation in Bulk Conduction Regime of Tri-Gate Junctionless Transistors | Jeon, Dae-Young; Mouis, Mireille; Barraud, Sylvain; Ghibaudo, Gerard |
2020-11 | Controlling the Effective Channel Thickness of Junctionless Transistors by Substrate Bias | Jeon, Dae-Young; Mouis, Mireille; Barraud, Sylvain; Ghibaudo, Gerard |
2008-10 | Effect of Rapid Thermal Annealing on the Electrical Properties of GaAs Schottky Diodes Embedded with Self-Assembled InAs Quantum Dots | Colleaux, Florian; Lee, Jungil; Yu, Byung Yong; Han, Ilki; Choi, Won Jun; Song, Jin Dong; Ghibaudo, Gerard |
2021-06 | Impact of Channel Length on the Operation of Junctionless Transistors With Substrate Biasing | Jeon, Dae-Young; Mouis, Mireille; Barraud, Sylvain; Ghibaudo, Gerard |
2017-03 | Impact of series resistance on the operation of junctionless transistors | Jeon, Dae-Young; Park, So Jeong; Mouis, Mireille; Barraud, Sylvain; Kim, Gyu-Tae; Ghibaudo, Gerard |
2008-04 | Low-frequency noise characterization of ZnO nanorod back-gate field-effect transistor structure | Lee, Jungil; Yu, Byung-Yong; Lee, Chul Ho; Yi, Gyu-Chul; Son, Seung Hun; Kim, Gyu-Tae; Ghibaudo, Gerard |
2011-03-28 | Low-frequency noise in junctionless multigate transistors | Jang, Doyoung; Lee, Jae Woo; Lee, Chi-Woo; Colinge, Jean-Pierre; Montes, Laurent; Lee, Jung Il; Kim, Gyu Tae; Ghibaudo, Gerard |
2008-07 | Physical understanding of the Hooge parameter in ZnO nanowire devices | Lee, Jungil; Han, Ilki; Yu, Byung-Yong; Yi, Gyu-Chul; Ghibaudo, Gerard |
2018-03 | Series resistance in different operation regime of junctionless transistors | Jeon, Dae-Young; Park, So Jeong; Mouis, Mireille; Barraud, Sylvain; Kim, Gyu-Tae; Ghibaudo, Gerard |