Browsing byAuthorHAN SEUNG HEE

Jump to:
All A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
  • Sort by:
  • In order:
  • Results/Page
  • Authors/Record:

Showing results 1 to 29 of 29

Issue DateTitleAuthor(s)
-A study of PSII treatment on polymeric materials in comparison with plasma treatmentLEE YEON HEE; HAN SEUNG HEE; 윤정현; LIM HYUN EUI
1992-01Auger electron spectroscopy analysis of Au/Ti/TiNxGaAs structure.KANG KWANG NHAM; Lee Jung Il; HAN SEUNG HEE; CHOI BYEONJ JIN; V. Bosy; Han Il Ki
-Characterization of plasma ion implanted polymeric materials in comparison with plasma treatmentLEE YEON HEE; HAN SEUNG HEE; LIM HYUN EUI; SUH MOO JIN; 나연화
-Characterization of solid surfaces using time-of-flight secondary ion mass spectrometry.LEE YEON HEE; HAN SEUNG HEE; Lee junghye; 윤정현
-Identification of automotive paints using time-of-flight secondary ion mass spectrometryLEE YEON HEE; HAN SEUNG HEE; 윤정현; KIM YOUNG MAN; 손성건; 박성우
-Identification of automotive paints using time-of-flight secondary ion mass spectrometryLEE YEON HEE; HAN SEUNG HEE; 윤정현; KIM YOUNG MAN; 손성건; 박성우
-keV and MeV ion beam modification of polyimide filmsLEE YEON HEE; HAN SEUNG HEE; SONG JONG HAN; LIM HYUN EUI; SUH MOO JIN
-Measurement of sheath expansion in plasma source ion implantation김곤호; 김영우; HAN SEUNG HEE; LEE YEON HEE; 엄한섭; 조정희; 홍문표
-Microstructure and composition changes of Cu-wire according to heat source박성우; 장익수; 김상현; 김윤희; KIM YOUNG DO; HAN SEUNG HEE; KIM YOUNG MAN
-Microstructure and composition changes of Cu-wire according to heat source김상현; Kyung-Hwa Lee; 김진표; 김윤희; 박성우; KIM YOUNG DO; HAN SEUNG HEE; KIM YOUNG MAN
-Microstructure and phase transition of Cu-wire by heat transformation김상현; 정진열; HAN SEUNG HEE; 오남렴; KIM YOUNG DO; KIM YOUNG MAN; 장익수; 박성우
-Plasma source ion implantation of nitrogen and carbon ions into co-cemented WCHAN SEUNG HEE; LEE YEON HEE; Lee junghye; 김해동; 김곤호; 김영우; 조정희
-Plasma source ion implantations for shallow junction조정희; HAN SEUNG HEE; LEE YEON HEE; 김옥경; 김곤호; 황현상; 김영우; LIM HYUN EUI; JUNG, HYE SUN; 백성권
-Plasma source ion implantations for shallow p+/n junction조정희; HAN SEUNG HEE; LEE YEON HEE; 김옥경; 김곤호; 김영우; LIM HYUN EUI; SUH MOO JIN
-Polymer surface modification using atmospheric pressure plasma source ion implantationHAN SEUNG HEE; LEE YEON HEE; Lee junghye; 김해동; 김곤호; 김영우; 조정희
-Structural characterization of branched polyesters using TOF-SIMS combined with transesterificationLEE YEON HEE; HAN SEUNG HEE; 윤정현; LIM HYUN EUI; SUH MOO JIN
-Study of PSII-treated PMMA, PHEMA, and PHPMA ; investigation of their surface stabilitiesLIM HYUN EUI; LEE YEON HEE; HAN SEUNG HEE; 조정희; SUH MOO JIN; 김강진
-Surface analysis for polymeric materials using TOF-SIMS.LEE YEON HEE; HAN SEUNG HEE; 윤정현; LIM HYUN EUI; SUH MOO JIN
-Surface characterization of ion beam-treated polymersLEE YEON HEE; HAN SEUNG HEE; LIM HYUN EUI; Hyesun Jung; 조정희; 김영우
-Surface modification of polymers using plasma source ion implantation.LEE YEON HEE; HAN SEUNG HEE; Lee junghye; 윤정현
-Surface treatment and characterization of PMMA, PHEMA, and PHPMALIM HYUN EUI; LEE YEON HEE; 조정희; HAN SEUNG HEE; 김강진
-The characterization of polystyrene derivatives of various polydispersity by MALDI-TOF-MS.LIM HYUN EUI; LEE YEON HEE; HAN SEUNG HEE; 김강진
-The measurement of nitrogen ion species ratio in the inductively coupled plasma source ion implantation조정희; HAN SEUNG HEE; LEE YEON HEE; 김옥경; 김곤호; 김영우; LIM HYUN EUI; SUH MOO JIN
-Time-of-flight secondary ion mass spectrometry of substituted polystyrenes.LEE YEON HEE; HAN SEUNG HEE
-TOF-SIMS and XPS study of modified polymer surfacesLEE YEON HEE; HAN SEUNG HEE; 권문희
-TOF-SIMS study of polymer film on various metallic substrates.LEE YEON HEE; HAN SEUNG HEE; 윤정현; LIM HYUN EUI; SUH MOO JIN
-(Undefined)조정희; HAN SEUNG HEE; LEE YEON HEE; 김영우; LIM HYUN EUI; SUH MOO JIN; 김곤호; 김옥경
-(Undefined)조정희; HAN SEUNG HEE; LEE YEON HEE; 김영우; LIM HYUN EUI; 김곤호; 김옥경
-(Undefined)김영우; 조정희; LIM HYUN EUI; HAN SEUNG HEE; LEE YEON HEE; 김곤호

BROWSE