| - | Asymmetric staggered electrode for oxide thin film transistors | Chong Eu Gene; Chun Yoon Soo; Jo Kyoungchul; Kim Seung Han; Lee Sang Yeol |
| - | Comprehensive study on the bias and temperature induced instability of ZnO based thin film transistors | Lee Sang Yeol; Chong Eu Gene; Kim Seung Han; Chun Yoon Soo |
| - | Improvement of bias stability of indium zinc oxide TFTs by the incorporation of hafnium fabricated by radio-frequency magnetron sputtering | Chong Eu Gene; Jo Kyoungchul; Kim Seung Han; Chun Yoon Soo; Lee Sang Yeol |
| - | Instability induced by air in amorphous Zn-Sn-O (ZTO) thin film transistor | Kim Seung Han; Chun Yoon Soo; Chong Eu Gene; Jo Kyoungchul; Chang-Il Kim; Lee Sang Yeol |
| - | Relation between processing parameters and performance of novel amorphous silicon-indium-zinc oxide thin film transistors | Chong Eu Gene; Kim Seung Han; Gun-Eik Jang; Lee Sang Yeol |
| - | Role of Hf in amorphous oxide thin film transistors fabricated by rf-magnetron sputtering | Chong Eu Gene; Chun Yoon Soo; Jo Kyoungchul; Kim Seung Han; Jung Da Woon; Lee Sang Yeol |
| - | Stability enhancement of amorphous zinc oxide thin film transistors fabricated by pulsed laser deposition with DBD | Chun Yoon Soo; Chong Eu Gene; Jo Kyoungchul; Kim Seung Han; Jung Da Woon; Lee Sang Yeol |
| - | Temperature Induced Instability of Passivation-Free Amorphous Indium Zinc Oxide (a-IZO) Thin Film Transistor | Chong Eu Gene; Chun Yoon Soo; Jo Kyoungchul; Kim Seung Han; Jung Da Woon; Lee Sang Yeol |
| - | The characteristics changing of HfInZnO TFT with process conditions by RF sputter | Jung Da Woon; Chong Eu Gene; Kim Seung Han; Chun Yoon Soo; Lee Sang Yeol |
