2009-06 | Atomic arrangement variations of 30 degrees in-plane rotation domain boundaries in ZnO thin films grown on Si substrates due to thermal annealing | Shin, J. W.; Lee, J. Y.; No, Y. S.; Kim, T. W.; Choi, W. K. |
2007-04-30 | Atomic arrangement variations of [0001]-tilt grain boundaries in ZnO thin films grown on p-Si substrates due to thermal treatment | Shin, J. W.; Lee, J. Y.; No, Y. S.; Jung, J. H.; Kim, T. W.; Choi, W. K. |
2009-07 | Atomic Arrangements of Asymmetrically-tilted Grain Boundaries in 30 degrees Rotation Domains of ZnO Thin Films Grown on n-Si Substrates | Yuk, J. M.; No, Y. S.; Kim, T. W.; Kim, J. Y.; Choi, W. K. |
2011-03-15 | Atomic structural variations of [0 0 0 1]-tilt grain boundaries during ZnO grain growth occurred by thermal treatments | Yuk, J. M.; Lee, J. Y.; Lee, Zonghoon; No, Y. S.; Kim, T. W.; Kim, J. Y.; Choi, W. K. |
2006-09-04 | Correlation between the atomic structures and the misorientation angles of [0001]-tilt grain boundaries at triple junctions in ZnO thin films grown on Si substrates | Shin, J. W.; Lee, J. Y.; No, Y. S.; Kim, T. W.; Choi, W. K. |
2006-09-30 | Dependences of the surface and the optical properties on the O-2/O-2+Ar flow-rate ratios for ZnO thin films grown on ZnO buffer layers | No, Y. S.; Kim, T. W.; Jung, Y. S.; Choi, W. K. |
2016-02 | Effect of RF power on the structural, optical and gas sensing properties of RF-sputtered Al doped ZnO thin films | Srinatha, N.; No, Y. S.; Kamble, Vinayak B.; Chakravarty, Sujoy; Suriyamurthy, N.; Angadi, Basavaraj; Umarji, A. M.; Choi, W. K. |
2010-11 | Effect of thermal annealing on the microstructural and electrical properties of Al-doped ZnO thin films grown on n-Si (100) substrates | Han, J. H.; No, Y. S.; Lee, J. Y.; Kim, T. W.; Kim, J. Y.; Choi, W. K. |
2011-06-15 | Effects of different annealing atmospheres on the surface and microstructural properties of ZnO thin films grown on p-Si (100) substrates | Shin, J. W.; No, Y. S.; Lee, J. Y.; Kim, J. Y.; Choi, W. K.; Kim, T. W. |
2006-07-01 | Effects of thermal treatment on the formation of the columnar structures in ZnO thin films grown on p-Si(100) substrates | Shin, J. W.; Lee, J. Y.; No, Y. S.; Kim, T. W.; Choi, W. K. |
2012-03 | Enhancement of electrical properties in Al-doped ZnO films by tuning dc bias voltage during radio frequency magnetron sputtering | No, Y. S.; Park, D. H.; Kim, T. W.; Choi, J. W.; Angadi, B.; Choi, W. K. |
2008-07-14 | Evolution mechanisms of the surface morphology of grains in ZnO thin films grown on p-InP substrates due to thermal annealing | Yuk, J. M.; Lee, J. Y.; No, Y. S.; Kim, T. W.; Choi, W. K. |
2008-10 | Formation and Microstructural Properties of Locally Distributed ZnSiO3 Nanoparticles Embedded in a SiO2 Layer by Using a Focused Electron Beam | Shin, J. W.; No, Y. S.; Kim, T. W.; Choi, W. K. |
2010-08-09 | Formation mechanisms of metallic Zn nanodots by using ZnO thin films deposited on n-Si substrates | Yuk, J. M.; Lee, J. Y.; Kim, Y.; No, Y. S.; Kim, T. W.; Choi, W. K. |
2008-04-15 | Formation mechanisms of ZnO amorphous layers due to thermal treatment of ZnO thin films grown on p-InP (100) substrates | Yuk, J. M.; Lee, J. Y.; No, Y. S.; Kim, T. W.; Choi, W. K. |
2011-02 | Formation mechanisms of ZnO nanocrystals embedded in an amorphous Zn2xSi1-xO2 layer due to sputtering and annealing | Shin, J. W.; Lee, J. Y.; No, Y. S.; Kim, T. W.; Choi, W. K. |
2006-12-15 | High work function of Al-doped zinc-oxide thin films as transparent conductive anodes in organic light-emitting devices | Kim, T. W.; Choo, D. C.; No, Y. S.; Choi, W. K.; Choi, E. H. |
2010-01 | Microstructural and surface property variations due to the amorphous region formed by thermal annealing in Al-doped ZnO thin films grown on n-Si (100) substrates | Han, J. H.; No, Y. S.; Kim, T. W.; Lee, J. Y.; Kim, J. Y.; Choi, W. K. |
2008-07-23 | The formation mechanism of periodic Zn nanocrystal arrays embedded in an amorphous layer by rapid electron beam irradiation | Shin, J. W.; Lee, J. Y.; No, Y. S.; kim, T. W.; Choi, W. K.; Jin, S. |
2011-08 | Thermal effects on the structural, electrical, and optical properties of Al-doped ZnO films deposited on glass substrates | Oh, D. H.; No, Y. S.; Kim, S. Y.; Cho, W. J.; Kim, J. Y.; Kim, T. W. |
2008-12-01 | Transformation mechanisms from metallic Zn nanocrystals to insulating ZnSiO3 nanocrystals in a SiO2 matrix due to thermal treatment | Yuk, J. M.; Lee, J. Y.; No, Y. S.; Kim, T. W.; Choi, W. K. |