A compact, sample-in-atmospheric-pressure soft x-ray microscope developed at Pohang Light Source

Authors
Lim, JunShin, Hyun-JoonChae, Keun HwaHwang, Chan-CukHwang, Han-NaHong, Chung Ki
Issue Date
2010-06
Publisher
AMER INST PHYSICS
Citation
REVIEW OF SCIENTIFIC INSTRUMENTS, v.81, no.6
Abstract
A full-field transmission soft x-ray microscope (TXM) was developed at the Pohang Light Source. With a 2 mm diameter condenser zone plate and a 40 nm outermost-zone-width objective zone plate, the TXM's achieved spatial resolution is better than 50 nm at the photon energy of 500 eV (wavelength: 2.49 nm). The TXM is portable and mounted in tandem with a 7B1 spectroscopy end station. The sample position is outside the vacuum, allowing for quick sample changes and enhanced in situ experimental capability. In addition, the TXM is pinhole-free and easy to align, having commercial mounts located outside the vacuum components. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3432000]
Keywords
RESOLUTION; TOMOGRAPHY; RESOLUTION; TOMOGRAPHY; full-field transmission soft x-ray microscope; Synchrotron radiation beamline
ISSN
0034-6748
URI
https://pubs.kist.re.kr/handle/201004/131398
DOI
10.1063/1.3432000
Appears in Collections:
KIST Article > 2010
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