KIST Library Institutional Repository

Quantitative phase analysis in tetragonal-rich tetragonal/monoclinic two phase zirconia by Raman spectroscopy

Authors

Kim, BK; Hahn, JW; Han, KR

Issue Date

1997-04-15

Publisher

CHAPMAN HALL LTD

Citation

JOURNAL OF MATERIALS SCIENCE LETTERS, v.16, no.8, pp.669 - 671

Keywords

X-RAY-DIFFRACTION; X-RAY-DIFFRACTION; phase analysis; tetragonal zirconia; Raman spectroscopy; Y-TZP

ISSN

0261-8028

URI

https://pubs.kist.re.kr/handle/201004/143840

DOI

10.1023/A:1018587821260

Appears in Collections:

KIST Article > Others

Files in This Item:

There are no files associated with this item.

Export

RIS (EndNote)

XLS (Excel)

XML