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Thickness dependence of crystalline orientation in YBa2Cu3Ox thin films grown by metalorganic chemical vapour deposition

Authors

Kang, WN; Kim, YH; Kim, CH; Jang, JW; Kim, IT; Choi, SS; Hahn, TS

Issue Date

1996-11-01

Publisher

CHAPMAN HALL LTD

Citation

JOURNAL OF MATERIALS SCIENCE LETTERS, v.15, no.21, pp.1898 - 1901

Keywords

MICROSTRUCTURE; LAALO3; MOCVD; MICROSTRUCTURE; LAALO3; MOCVD

ISSN

0261-8028

URI

https://pubs.kist.re.kr/handle/201004/144240

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KIST Article > Others

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