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Phase identification of the interfacial reaction product of SiC//p/Al composite using convergent beam electron diffraction technique.

Other Titles

수렴성 빔 전자회절법을 이용한 SiC//p/Al 복합재에서의 계면 생성물의 상분석 =

Authors

이정일; 이재철; 석현광; 이호인

Issue Date

1996-01

Citation

한국전자현미경학회지 = Korean J. electron microscopy, v.v. 26, no.no. 1, pp.95 - 104

Keywords

SiC//p/Al composite

URI

https://pubs.kist.re.kr/handle/201004/144773

Appears in Collections:

KIST Article > Others

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