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Interfacial defects in SiO₂-glass bond during VCR head fabrication

Other Titles

VCR 헤드 제조시 SiO₂ 박막과 유리의 계면 결함

Authors

윤능구; 황재웅; 고경현; 안재환; 제해준; 홍국선

Issue Date

1994-01

Citation

한국재료학회지 = Korean journal of materials research, v.4, no.1, pp.31 - 36

Keywords

VCR 헤드; VCR head; SiO₂ 박막; SiO₂ thin film; 계면 결함; inteface defect

URI

https://pubs.kist.re.kr/handle/201004/145831

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KIST Article > Others

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