Studies on structural and electrooptic properties of ferroelectric bismuth titanate thin films
- Authors
- Jo, W.; Cho, H.-J.; Noh, T.W.; Cho, Y.S.; Kwun, S.-I.; Byun, Y.T.; Kim, S.H.
- Issue Date
- 1994-01
- Citation
- Ferroelectrics, v.152, no.1, pp.139 - 144
- Abstract
- Ferroelectric bismuth titanate thin films have been deposited on LaA103, SrTi03, MgO, Al2O3, and ZrO2/SiO2/Si substrates using a Q-switched Nd:YAG laser. X-ray diffraction studies show that most films on single crystal substrates have preferential crystallographic orientation. The film on MgO(11O) shows large electrooptic characteristics with an effective electrooptic coefficient of about 3.8xl0-15 m2/V2. Using a lens coupling method, it is demonstrated that light can propagate along the Bi4Ti3O12 layer in a Bi4Ti3O12/ZrO2/SiO2/Si(100) heterostructure. ？ 1994, Taylor & Francis Group, LLC. All rights reserved.
- Keywords
- Bismuth compounds; Crystal orientation; Deposition; Electric properties; Electrooptical effects; Light propagation; Optical properties; Q switched lasers; Refractive index; Substrates; Thin films; X ray analysis; Crystallographic orientation; Electro optic properties; Ferroelectric thin films; Heterostructure; Lens coupling method; X ray diffraction; Dielectric films; Bismuth compounds; Crystal orientation; Deposition; Electric properties; Electrooptical effects; Light propagation; Optical properties; Q switched lasers; Refractive index; Substrates; Thin films; X ray analysis; Crystallographic orientation; Electro optic properties; Ferroelectric thin films; Heterostructure; Lens coupling method; X ray diffraction; Dielectric films
- ISSN
- 0015-0193
- Appears in Collections:
- KIST Article > Others
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