Short consideration on the non-uniformities existing at the etched-edges in deep anisotropic etching of (100) silicon
- Other Titles
- (100) 실리콘의 깊은 비등방성 식각시 식각면의 가장자리에 존재하는 불균일성의 짤막한 고찰
- Authors
- 주병권; 하병주; 김철주; 오명환; 차균현
- Issue Date
- 1992-01
- Citation
- 한국재료학회지 = Korean Journal of Materials Research, v.2, no.5, pp.383 - 386
- Keywords
- MEMS; micromachining; deep silicon etching; diaphragm
- ISSN
- 1225-0562
- URI
- https://pubs.kist.re.kr/handle/201004/146612
- Appears in Collections:
- KIST Article > Others
- Files in This Item:
There are no files associated with this item.
- Export
- RIS (EndNote)
- XLS (Excel)
- XML
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.