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Characterization of a MOCVD grown GaAs/AlGaAs superlattice using spectroscopic ellipsometry.

Authors

김용; 김무성; 김상열; 엄경숙; 민석기

Issue Date

1991-01

Publisher

Korean Physical Society

Citation

Journal of the Korean Physical Society, v.v. 24, pp.359 - ?

Keywords

spectroscopic ellipsometry; superlattice; MOCVD

ISSN

0374-4884

URI

https://pubs.kist.re.kr/handle/201004/146919

Appears in Collections:

KIST Article > Others

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