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A study on silicon/silicon dioxide interface by C-V techniques.

Other Titles

C-V 방법에 의한 Si/SiO//2 계면상태 연구 =

Authors

강광남; 이정일; 이명복; 주병권; 김형곤; 오명환

Issue Date

1990-11

Citation

응용물리, v.v. 3, no.no. 4, pp.536 - 541

Keywords

silicon; silicon dioxide interface

URI

https://pubs.kist.re.kr/handle/201004/147028

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KIST Article > Others

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