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Hot-carrier-induced deradation in submicron MOS transistors.

Other Titles

Submicron MOS 트랜지스터의 뜨거운 운반자에 의한 노쇠 현상 =

Authors

강광남; 최병진

Issue Date

1988-01

Citation

전자공학회논문지, v.v. 25, no.no. 7, pp.780 - ?

Keywords

MOS transistors

URI

https://pubs.kist.re.kr/handle/201004/147661

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KIST Article > Others

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