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Showing results 1 to 30 of 543

Issue DateTitleAuthor(s)
2015-111/f Noise Characteristics of AlGaN/GaN FinFETs with and without TMAH surface treatmentV Sindhuri; 손동혁; 이동기, et al
2011-02A Comparative study for gas-phase dehydration of glycerol over H-zeolites정광덕; 김용태; 박은덕
2010-07A design of Novel IGBT with Oblique Trench Gate오주현; 천대환; 이의복, et al
2001-11A method of improving dielectric constant and adhesion strength of methyl silsesquioxane by using a NH3 plasma treatment김용태
2001-04A method of improving dielectric constant and adhesion strength of methysilsesquioxyane by using a NH3 plasma treatment심현상; 김용태; 김동준, et al
2012-05A new atomic layer deposition method and electrical performance of WN diffusion barrier for Cu nano via contact structures김영환; 황영현; 조원주, et al
2003-05A new atomic layer deposition of tungsten nitride diffusion barrier with NH₃ pulse plasma and WF6 gas김용태; 심현상; 김성일
2004-09A new atomic layer deposition of W_N thin films심현상; 박지호; 김용태
2001-07A new ferroelectric gate structure for low power operation of non volatile memory devices김용태; 심선일; 김성일, et al
1991-01A new method to suppress encroachment by plasma deposited tungsten thin films.김용태; 민석기; 김충기
2003-10A new pulse plasma enhanced atomic layer deposition of tungsten nitride diffusion barrier for copper interconnect심현상; 김성일; 전형탁, et al
1997-09A proposal of Pt-SrBi//2Ta//2O//9/CeO//2/Si structure for non destructive read out memory devices신동석; 김용태; 한용희
2012-07A Study on the Design and Electrical Characteristics Enhancement of the Floating Island IGBT with Low On-ResistanceEun Sik Jung; Yu Seup Cho; Ey Goo Kang, et al
1988-01A study on the nucleation, growth and shrinkage of oxidation induced stacking faults(OSF), part I: nucleation and thermal behavior of oxidation induced stacking faults.김용태; 김춘근; 민석기
2011-11A study on the optimal design of 600V GaN power MOSFET using Al2O3 gate oxide김용태; 강이구; 장호정
1988-01A stydy on the necleation, growth and shrinkage of oxidation induced stacking faults(OSF)김용태; 민석기
2006-12A transmission electron microscopy study on the atomic arrangement and grain growth of hexagonal structured Ge2Sb2Te5박유진; 이정용; 김용태
2008-08A transmission electron microscopy study on the crystallization of Sb-Se-Te thin films deposited by rf sputtering method윤종문; 선창우; 이정용, et al
1998-10Absorption properties of the epitaxial Alx-Ga1-xN grown by plasma induced molecular beam epitaxy김제원; 손창식; 심선일, et al
2015-09Accuracy of Recessed Gate for GaN Power FETs and High Temperature Capability of Diamond Heat Sink김용태; 이정희; 전영민
1997-01Achievement of zero temperature coefficient of resistance with RuO//x thin film resistors김용태
2000-07Achievment of high memory window of YMnO3/Si gate by thermal treatment in nitrogen ambient김익수; 최재형; 김용태, et al
1996-01Advantages of Ruo//x bottom electrode in the dielectric and leakage characteristics of (Ba, Sr)TiO//3 capacitor.김용태; 이창우
1998-09AlGaAs/GaAs heteroface solar cells grown by metalorganic chemical vapor deposition박영균; 김성일; 김용, et al
2013-04Algorithm for EUV Mask Actinic CD Measurement using Scattered Light조정근; 김기혁; 이동수, et al
2006-04Alternative Material Candidates and Scaling of Programming Dimension for Phase Change Random Access Memory김용태; 김성일
2004-01An expedient entry to chromane derivatives via indium-mediated intramolecular allenylation reactions강한영; 김용태; 유연권, et al
2000-01An organometallic mercaptopyridine complex with unusual bond shift fluxionality: metal-mediated tautomerism of (pentamethylcyclopentadienyl)bis(pyridine-2-thiolato)rhodium( Ⅲ )정옥상; 이영아; 김용태, et al
2006-09Analysis of dynamic response characteristics of PRAM cell김은태; 박유진; 염민수, et al
2006-07Analysis of dynamic response characteristics of PRAM cell김용태; 박유진; 이정용, et al

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