| - | A comparison of quantitative analysis for various matrix containing Fe/Ni by depth profiling of dynamic SIMS | LIM, WEON CHEOL; Lee Ji-hye; LEE, YEON HEE |
| - | A Quantitative Analysis for CIGS Thin Films by Dynamic Secondary Ion Mass Spectrometry | LIM, WEON CHEOL; Lee Ji-hye; Won, Sung Ok; LEE, YEON HEE |
| - | A Study of Dynamic SIMS analysis of Cu(In Ga)Se2 (CIGS) | LIM, WEON CHEOL; Lee Ji-hye; LEE, YEON HEE |
| - | A study of heat transfer fluids for refrigeration system using direct contact method | Hong Ju Hi; SHIN, YOU HWAN; Kim, Youngil; LEE, YEON HEE; Kang-Jin Kim |
| - | A Study on the Determination of Iodine in Serum, Fresh Milk, and Feed Additive by Methane Mixed Plasma/ICP/MS | PARK, KYUNG SU; LEE, YEON HEE |
| 2003-10-01 | Adhesion improvement of polymer/metal systems by using PSII | LEE, YEON HEE |
| 1999-12-01 | Adhesion improvement of Pt/SiO2 by plasma source ion implantation | LEE, YEON HEE |
| 2020-10 | Analysis and Characterization of Catechol lipid based Natural Lacquers According to the Types of Catechol Lipid Molecules | Lee hanna; DONGYOUNG KIM; 이보라; LEE, YEON HEE; Lee, Sang-Soo; Jung Ah Lim |
| - | Analysis of fluorine-containing thin films using surface techniques | Youngsoo, Kim; Kang-Jin Kim; LEE, YEON HEE |
| - | Analysis of Natural Dyes in Archaeological Textiles using TOF-SIMS and other Analytical Techniques | Lee Ji-hye; Kim,Man-Ho; LEE, KANG BONG; Elsa van Elslande; Philippe Walter; LEE, YEON HEE |
| - | Analysis of simazine and diuron residues in aquarium sea water and live-fishes with HPLC-UV | NAM, YUN SIK; CHA, KI SUK; LEE, KI SOO; PARK, HYUN MEE; LEE, YEON HEE; LEE, KANG BONG |
| - | Applications of SIMS and XPS in cultural heritage science | LEE, YEON HEE |
| - | Applications of surface analytical techniques for organic materials in archaeology or forensic science | LEE, YEON HEE; Lee Ji-hye; S. Ham; LEE, KANG BONG |
| - | Applications of TOF-SIMS for organic materials in archaeology and forensic sicence | LEE, YEON HEE; Lee Ji-hye; Youngsoo, Kim; Seokchan Choi; Seung Wook Ham; LEE, KANG BONG; Chiwoo Lee; Kang-Jin Kim |
| 2005-10-01 | Characerization of organic compounds on modified polyimide surfaces using TOF-SIMS in combination with derivatization | LEE, YEON HEE |
| - | Characterization and Sequence Determination of Ball-point Pen Inks and Red Sealing-inks by TOF-SIMS and ATR FT-IR | Lee Ji-hye; Cho Youn Jeong; NAM, YUN SIK; LEE, KANG BONG; LEE, YEON HEE |
| - | Characterization of Cu(InGa)Se2 (CIGS) Thin Films in Solar Cell Devices by Secondary Ion Mass Spectrometry | LIM, WEON CHEOL; Lee Ji-hye; Won, Sung Ok; LEE, YEON HEE |
| - | Characterization of Cu(InGa)Se2 (CIGS) thin films in solar cell devices by secondary ion mass spectrometry | LIM, WEON CHEOL; Lee Ji-hye; LEE, YEON HEE |
| - | Characterization of dyed textiles using TOF-SIMS with PCA | Lee Ji-hye; A. Ceglia; 김강진; LEE, YEON HEE |
| - | Characterization of fluorocarbon fhin films deposited by ICP and PP | Lee Ji-hye; K. Kim; LEE, YEON HEE |
| - | Characterization of microphase-separated diblock copolymer films by TOF-SIMS | Lee Ji-hye; Min Hwa Kang; LIM, WEON CHEOL; Kwanwoo Shin; LEE, YEON HEE |
| 2003-10-01 | Characterization of modified polymer surfaces | LEE, YEON HEE |
| - | Characterization of Nanostructures in Blend and Copolymer films depend on Annealing Condition | Kang Minhwa; Lee Ji-hye; LEE, YEON HEE |
| - | Characterization of organic compounds on modified polyimide surfaces using TOF-SIMS in combination with derivatization | LEE, YEON HEE; KWON MOON HEE; Hong Ju Hi; Youngsoo, Kim |
| - | Characterization of PSII-treated polyimide surfaces | LEE, YEON HEE; HAN, SEUNG HEE; KWON MOON HEE; Haidong Kim |
| - | Characterization of surface structures of blending homopolymer and diblock copolymer films by AFM | Minhwa Kang; 이지혜; LEE, YEON HEE |
| - | Chemical composition and lead isotope ratio analysis for iron armor by SIMS | Lee Ji-hye; LEE, YEON HEE; K. Kim |
| 2001-04-01 | Cluster glass transitions in styrene-co-citraconate ionomers | LEE, YEON HEE |
| - | Comparision of conventional lacquer and cashew coatings by TOF-SIMS and XPS | Lee Ji-hye; LEE, YEON HEE; 함승욱; 김규호; 김강진 |
| - | Comparison of Quantitative Analysis for CIGS Thin Films by TOFSIMS, Magnetic Sector SIMS, and AES | 김선희; Jang Yun Jung; 윤정현; Jeung-hyun Jeong; LEE, YEON HEE |
