| - | Abnormal grain growth in a liquid matrix. | PARK YOUNG JOON; 윤덕용; Nong Moon Hwang |
| - | Boron nitride films grown by low energy ion beam assisted deposition | PARK YOUNG JOON; Baik Young Joon |
| - | Effects of current wave forms and current densities on the electroplated Cu interconnection in damascene plating | 이유용; PARK YOUNG JOON; Cho Byung Won; 이재봉 |
| - | Electromigration-induced stress interaction between via and polygranular cluster | PARK YOUNG JOON; 최인석; 주영창 |
| - | Heteroepitaxial growth of β -SiC using plasma activated methane and silane sources | 김홍석; PARK YOUNG JOON; 최인훈; EUN KWANG YONG; Baik Young Joon |
| - | Interconnect failure mechanism maps for different metallization materials and processes | V. K. Andleigh; PARK YOUNG JOON; C. V. Thompson |
| - | Laser machining of chemical vapor deposited (CVD) diamond films | PARK YOUNG JOON; Baik Young Joon; V. Ralchenko |
| - | Nucleation behavior of diamond on (001) silicon substrate in alternating current biasing pretreatment | 김도근; PARK YOUNG JOON; 0; EUN KWANG YONG; Baik Young Joon |
| - | Post-treatment induced resistivity changes of undoped diamond thin films | 이범주; PARK YOUNG JOON; 안병태; EUN KWANG YONG; Baik Young Joon |
| - | Simulations of stress evolution and the current density scaling of electromigration-induced failure times in pure and alloyed interconnects | Vaibhav K. Andleigh; PARK YOUNG JOON; Carl V. Thompson |
| - | Stress effect on interconnect reliability due to electromigration | PARK YOUNG JOON; 주영창 |
| - | Temperature dependence of abnormal growth of faceted grains in a liquid matrix. | PARK YOUNG JOON; 윤덕용; PARK CHAN WOO |
| - | The effects of post annealing on the electrical characteristics of thin PECVD oxide. | PARK YOUNG JOON; 노태문; 백종태; 남기수 |
| - | ULSI interconnect failures due to electromigration-induced stress evolution: computer simulation study | PARK YOUNG JOON; Vaibhav K. Andleigh; Carl V. Thompson; 최인석; 주영창 |
| 2001-10 | 구리배선의 electromigration 신뢰성 | PARK YOUNG JOON |
