| - | Correlation between charge injection and memory window in the ferroelectric gate stack structures | Sung-Kyun Lee; 최인훈; 이철의; Kim Yong Tae; KIM CHUN KEUN |
| - | Correlation between surface modification of HSQ films and phase transformation of Cu/W-N bilayers deposition on the NH3 plasma treated HSQ films | 김동준; 심현상; 박종완; Kim Yong Tae; Kim Seong Il; KIM CHUN KEUN |
| - | Defect states in silicon after laser processing. | Kim Seong Il; Min Suk-Ki; CHOI WON CHEOL; KIM EUN KYU; CHO HOON YOUNG; KIM CHUN KEUN |
| - | Dependence of crystallinity of SrBi2Ta2O9 thin films on crystallinity of YMnO3/Si substrates | Ho Nyung Lee; 김익수; Kim Yong Tae; PARK YOUNG KYUN; Kim Seong Il; KIM CHUN KEUN; 조성호 |
| - | Effect of hydrogen annealing on electrical properties of Bi-layered perovskite thin films | KIM CHUN KEUN; 김익수; 최훈상; Kim Seong Il; 이창우; Kim Yong Tae |
| - | Effect of thickness of ferroelectrics and insulators on the memory window of ferroelectric gate capacitors | Sung-Kyun Lee; Kim Yong Tae; KIM CHUN KEUN; Kim Seong Il; 이철의 |
| - | Effects of Bi content on electrical properties of Pt/SrBi//2Nb//2O//9/Si ferroelectric gate structure | Kim Yong Tae; Kim Seong Il; 최훈상; KIM CHUN KEUN; 이창우 |
| - | Enhancement of the electical and physical properties of Cu/W-N/HSQ interconnection scheme by NH₃ plasma treatment | 김동준; 심현상; Kim Yong Tae; KIM CHUN KEUN; 박종완 |
| - | Improvement in the characteristics of ammonia plasma treated MSQ(Methyl Silsesquioxane) | 심현상; 김동준; KIM CHUN KEUN; Kim Seong Il; Kim Yong Tae; 전형탁 |
| - | Pulsed excimer laser annealing effects of ion implanted silicon on insulator. | Kim Seong Il; Min Suk-Ki; KIM EUN KYU; Kim Yong Tae; KIM CHUN KEUN; KIM MOO SUNG |
