Showing results 1 to 11 of 11
Issue Date | Title | Author(s) |
---|---|---|
- | Actinic EUV Mask Inspection using Coherent EUV Source based on High-order Harmonic Generation | Kim Yong Soo; Park June; Park Han Young; Hamin Sung; Jomsool Kim; Seung Beom Lee; Hyun Woo Cho; Ju Han Lee; Park, Min-Chul; Jhon, Young Min |
- | CD Measurements of EUV Mask using a Coherent Scattering Microscope Mask Inspection Tool | Kim Yong Soo; Park June; 성하민; 김점술; 이승범; 조현우; Park, Min-Chul; Cho, Woon Jo; Kim, Yong Tae; 이주한; Jhon, Young Min |
- | Characteristic Analysis of Coherent EUV Light Source based on High-order Harmonic Generation | Kim Yong Soo; Park June; Kim Younghee; 성하민; 김점술; 이승범; 조현우; Cho, Woon Jo; Kim, Yong Tae; 이주한; Jhon, Young Min |
- | Characteristics of the Coherent EUV Light Source for EUV Metrology | Kim Yong Soo; Kim Younghee; Park June; Hamin Sung; Jomsool Kim; Ju Han Lee; Jhon, Young Min |
- | Coherent EUV Light Source using a Gas Capillary based on High-order Harmonic Generation | Park Han Young; Kim Yong Soo; 성하민; 김점술; 이주한; Jhon, Young Min |
- | Design and Construction of an EUV Grating Spectrometer for the High Harmonic Generation at 13.5 nm | 김점술; 함용희; 정재룡; 권승호; Sung Hamin; Kim Yong Soo; Jhon, Young Min |
- | Design of EUV Mirror Using ZrN/Si Thin Films | Kim Yong Soo; Sung Hamin; Kim Young Jin; Cho, Woon Jo; 이주한; Kim, Yong Tae; Jhon, Young Min |
- | Development of a Coherent EUV Light Source for EUV Mask Inspection | Kim Yong Soo; Ahn Joonmo; 성하민; Cho, Woon Jo; Park, Min-Chul; 김점술; KIM, JAE HUN; Woo, Deok Ha; Lee, Seok; Ju Han LEE; Kim, Yong Tae; Jhon, Young Min |
- | Development of Coherent EUV Light Source for EUV Metrology | Sung Hamin; Kim Yong Soo; Cho, Woon Jo; Park, Min-Chul; 함용희; 김점술; KIM, JAE HUN; Woo, Deok Ha; Lee, Seok; 이주한; Kim, Yong Tae; Jhon, Young Min |
- | Development of Coherent Scattering Microscopy Mask Inspection System using a Coherent EUV Light Source | Jhon, Young Min; Kim Yong Soo; Ahn Joonmo; Lee, Ju han; Sung, Hamin; Kim, Jomsool; 이승범; 조현우; Park, Min-Chul; Cho, Woon Jo; Kim, Yong Tae |
- | Output Characteristics of a Coherent EUV Light Source for EUV Mask Inspection | Jhon, Young Min; Kim Yong Soo; Ahn Joonmo; Sung, Hamin; Cho, Woon Jo; Park, Min-Chul; Kim, Jomsool; Lee, Ju Han; KIM, JAE HUN; MINAH SEO; Lee, Seok; Kim, Yong Tae |